Yield and Cost Comparison

• The focus of USEA is maximizing process yields. USEA test yields are maximized by strict process controls, strong engineering resources and data analysis tools.

• The following program will allow you to determine how process yield contributes to profit.

WAFER	PRICE			COST
WAFER	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Wafer cost ($)
Units/Wafer
Die cost ($)
Sort cost per die ($)
Yield (%)
Cost sub-total e sort ($)
Good units

ASSEMBLY	PRICE			COST
ASSEMBLY	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Start Qty
Assembly cost per Unit ($)
Assembly Yield (%)
Good Units
Total Assembly Cost ($)
Cost Sub Total ($)

FINAL TEST 1	PRICE			COST
FINAL TEST 1	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Start Qty
Final Test 1 cost ($)
Final Test 1 Yield (%)
Good Units
Production cost per unit ($)
Cost Sub Total

BURN-IN	PRICE			COST
BURN-IN	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Start Qty
Burn-In cost ($)
Burn-In Yield (%)
Good Units
Production Cost Per Unit ($)
Cost Sub Total

FINAL TEST 2	PRICE			COST
FINAL TEST 2	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Start Qty
Final Test 2 cost ($)
Final Test 2 Yield (%)
Good Units
Production cost per unit ($)
Cost Sub Total

TAPE & REEL	PRICE			COST
TAPE & REEL	USEA	Vendor X	Vendor Y	USEA	Vendor X	Vendor Y
Start Qty
Final Test 2 cost ($)
Final Test 2 Yield (%)
Good Units
Production cost per unit ($)
Cost Sub Total

Total Good Unit
ASP ($)

Total Revenue ($)
Production Cost ($)
Shipping Cost ($)
Support Cost ($)
Total Production Cost ($)
Total Cost Per Unit($)

Operation Profit ($)

Our Yield is Better.

1. Many companies focus on the cost per hour for test.

2. Focus on test cost per hour may result in slightly lower unit of cost test, sacrificing process yield.

3. Test cost per hour has no incentive to maximize test yields.

4. Test contacts degradation is common cause of yield loss.

5. The corrective action results in significant down time and increased contactor cost.